Self calibrating measurement system
US7505132B2 · kind B2 · utility
2Cited by
10References
15Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Dec 11, 2006 |
| Grant date | Mar 17, 2009 |
| Priority date | — |
| Expiry date | May 16, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2015/0294
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A measurement system that can self calibrate is disclosed. The measurement system comprising a first light source directed along a first axis and configured to illuminate a sample volume. The measurement system has a sensor aligned along a second axis and is configured to detect scattered light in the sample volume. The measurement system has a second light source aligned along the second axis that is configured to illuminate the sensor during a calibration procedure.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.