Method for enabling comprehensive profiling of garbage-collected memory systems
US7506317B2 · kind B2 · utility
24Cited by
9References
16Claims
0Family size
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Key dates
| Filing date | Jan 16, 2004 |
| Grant date | Mar 17, 2009 |
| Priority date | — |
| Expiry date | Sep 26, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/3466
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method and apparatus for profiling a heap. According to the method, a flexible and comprehensive general-purpose profiling interface that uniformly accommodates a wide variety of memory allocation and garbage collection methods is used. The profiling interface, among other things, employs a set of virtual machine profiling interface events that support all known types of garbage collection methods.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.