Patent · US Expired

Method and device for analysing surface structure in paper or board

US7510629B2 · kind B2 · utility

0Cited by
2References
9Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 28, 2004
Grant dateMar 31, 2009
Priority date
Expiry dateJul 8, 2025

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06T2207/30124
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method for analyzing in real-time in a paper machine or board machine the surface structure of a web (1) of paper or board which method comprises the direction of an imaging system towards a pre-determined area (3) of the web (1), the arrangement of an illumination system to illuminate the region from a pre-determined direction with obliquely incident light, and the arrangement of an image analysis system in association with the imaging system. Furthermore, the method comprises, according to the invention, an image capture step (7) in which the imaging system is caused to take several digital images of the web under the said oblique incident illumination and during a pre-determined period, which images form an image sequence that images a series of surface sections (4, 4′, 4″) along a band (8) in the web (1), and an evaluation step (9) that is carried out by the image analysis system and which comprises an image analysis step (11), which in turn comprises a first analysis operation (16) in which the variance of the pixel values in each pixel row in each image in the image sequence is determined within a pre-determined wavelength band, and a second analysis operation (17) in which…

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.