Method for process control of mechanical embossing
US7510675B2 · kind B2 · utility
2Cited by
4References
14Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Jun 25, 2007 |
| Grant date | Mar 31, 2009 |
| Priority date | — |
| Expiry date | Jun 25, 2027 |
Classification
- Technology area (CPC B)Performing Operations; Transporting
- CPC primaryB29L2031/732
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Disclosed is both a method and apparatus for controlling and measuring an embossed texture on a decorative article. The embossed textured article includes both peaks and valleys that are measured and quantified to determine a profile of the textured article. Typically, the textured article comprises both chemically and mechanically embossed areas. The method uses moving average subtraction and peak/valley determinations to eliminate web flutter that often distorts the quantification of the mechanically embossed texture. The resulting profile may then be used to control a desired embossed profile.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.