Patent · US Active

Apparatus for detecting particles

US7511278B2 · kind B2 · utility

1Cited by

6References

20Claims

0Family size

Assignee

SPECTRO ANALYTICAL INSTRUMENTS GMBH · DE

Inventors

Adi A. Scheidemann · Seattle, US
Dirk Ardelt · Krefeld, DE
M. Bonner Denton · Tucson, US

Key dates

Filing date	Jan 30, 2006
Grant date	Mar 31, 2009
Priority date	—
Expiry date	Jun 8, 2026

Classification

Technology area (CPC H)Electricity
CPC primaryH01J49/025
WIPO fieldElectrical machinery, apparatus, energy
WIPO sectorElectrical engineering

Abstract

An apparatus for detecting particles, comprising a plurality of electrically conductive structures disposed on a support element. The structures are electrically insulated from one another and each structure can be electrically connected to an electronic read-out device. The structures receive a beam of particles in a direction forming an angle of incidence with the support element. A trough is disposed between each two successive structures as viewed in the beam direction. And at least partial overlap exists between each two successive structures. The apparatus can be disposed in the focal plane of a mass spectrometer.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.