Patent · US Expired

Method and device for monitoring a reference half cell

US7511504B2 · kind B2 · utility

3Cited by

3References

11Claims

0Family size

Assignee

Endress+Hauser Conducta Gesellschaft fuer Mess- und Regeltechnik mbH + Co. KG · DE

Inventors

Torsten Pechstein · Radebeul, DE
Katrin Scholz · Dippoldiswalde, DE
Sven Haertig · Frankenhain, DE

Key dates

Filing date	Nov 13, 2003
Grant date	Mar 31, 2009
Priority date	—
Expiry date	Sep 9, 2024

Classification

Technology area (CPC G)Physics
CPC primaryG01N27/4165
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A method for monitoring a reference half cell, which forms with a measuring half cell a potentiometric measuring point for determining and/or monitoring an ion concentration of a medium. The ion concentration of the mediums determined on the basis of at least one measurement signal determined in a measuring circuit, between the measuring half cell and the reference half cell. According to the invention, the measuring point is operated intermittently in an operating mode and in a test mode, wherein, in the operating mode, the ion concentration is measured and wherein, in the test mode, the proper functioning of the reference half cell is checked.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.