Patent · US Expired

Method and apparatus for detection of inclusion in glass

US7511807B2 · kind B2 · utility

8Cited by
12References
41Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 30, 2003
Grant dateMar 31, 2009
Priority date
Expiry dateDec 1, 2024

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N21/552
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Inclusions in a transparent panel (5) are detected by placing a light transmissive interface (3) in contact with the panel (5), and transmitting a beam of light (1) through interface (3) into panel (5). Within the panel (5), the light beam (7) propagates along a path including total internal reflections at surfaces of panel (5). When the light beam (1) intercepts inclusions (10) or other defects at least some of it is scattered, and leaves the panel (5). This scattered light is then observed. Thus, a large zone of the panel (5) can be inspected, with light only being detected in the case that it arises from scattering by inclusions or other defects.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.