Method for estimating and reporting the life expectancy of flash-disk memory
US7512847B2 · kind B2 · utility
53Cited by
6References
34Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Feb 6, 2007 |
| Grant date | Mar 31, 2009 |
| Priority date | — |
| Expiry date | May 2, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C2029/5002
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method for managing a memory device, a memory device so managed and a system that includes such a memory device. A value of a longevity parameter of the device is monitored after a data operation on the device in which the monitoring is performed by the device. A grade of the device is derived from the value. Preferred longevity parameters include a ratio of successfully-processed data to unsuccessfully-processed data and a deviation in a power consumption of the device. The grade serves as a forecast of a life expectancy of the memory. Preferred grades include: a comparison grade, a maximum grade, and an average grade.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.