Method of improving electronic component testability rate
US7512914B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 26, 2006 |
| Grant date | Mar 31, 2009 |
| Priority date | — |
| Expiry date | Mar 15, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/318307
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of improving the electronic component testability rate is provided. The method includes the steps of: designing a circuit, providing electronic component data of the circuit, extracting the test data of electronic components, providing a circuit board and making a test position table, providing an electronic component test fixture and a test program, determining whether the test program is appropriate, debugging the test program, and obtaining a test report. This increases the electronic component testability rate. At the same time, it improves the conventional test method that only provides information of where test points are still needed but no further detail.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.