Enhanced uniqueness for pattern recognition
US7514274B2 · kind B2 · utility
1Cited by
9References
16Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Dec 6, 2004 |
| Grant date | Apr 7, 2009 |
| Priority date | — |
| Expiry date | Dec 6, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30148
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
The present invention describes a test structure with a first set of features which is a subset of product features; and a second set of features adjacent to the first set of features, the second set occupying a smaller area than the first set and the second set being similar to the first set yet being distinguishable from surrounding structures.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.