Method and apparatus for predicting the reliability of electronic systems
US7514941B2 · kind B2 · utility
4Cited by
7References
23Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Mar 15, 2006 |
| Grant date | Apr 7, 2009 |
| Priority date | — |
| Expiry date | Mar 15, 2026 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH05K2203/163
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
An apparatus for predicting the reliability of an electronic system is provided. The apparatus includes at least one component, a stress sensor operable to measure stress of the at least one component, a resistance sensor operable to measure an electrical resistance of the at least one component, and an electronic control system coupled to the stress sensor and resistance sensor operable to predict the reliability of the electronic system using the stress and electrical resistance of the at least one component.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.