Systems and methods for measuring uniformity in images
US7515305B2 · kind B2 · utility
25Cited by
5References
23Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Mar 18, 2005 |
| Grant date | Apr 7, 2009 |
| Priority date | — |
| Expiry date | Jun 19, 2027 |
Classification
- Technology area (CPC B)Performing Operations; Transporting
- CPC primaryB41J29/393
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A method for measuring spatial uniformity in an image is provided and includes printing a test pattern from an image forming device having a plurality of strips and rows of fiducials proximal thereto. The method further provides for correcting of distortions in an image caused by printing and scanning artifacts and mapping from scanner coordinates to digital image coordinates. A gray level of each strip in the plurality of strips is determined as a function of digital image cross process coordinate. The method further provides for a profile of each strip to be filtered whereby the artifacts from a halftone screen are eliminated.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.