Patent · US Active

User-placed marks in a long record length waveform

US7516028B2 · kind B2 · utility

0Cited by
5References
15Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 2, 2006
Grant dateApr 7, 2009
Priority date
Expiry dateAug 2, 2026

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/31703
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A test and measurement instrument includes a memory configured to store a digitized signal, a display configured to display the digitized signal, a mark interface configured to generate a mark creation signal, a processor coupled to the memory, the display, and the mark interface. The processor is configured to identify a feature of the digitized signal and create a mark indicating the feature and the digitized signal in response to the mark creation signal.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.