Patent · US Active

Method and device for the subjective determination of aberrations of higher order

US7517087B2 · kind B2 · utility

24Cited by
6References
21Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 28, 2007
Grant dateApr 14, 2009
Priority date
Expiry dateDec 28, 2027

Classification

  • Technology area (CPC A)Human Necessities
  • CPC primaryA61B3/028
  • WIPO fieldMedical technology
  • WIPO sectorInstruments

Abstract

A device for the subjective determination of aberrations of higher orders Xi in an optical system, in particular in an eye includes at least one observation channel into which defined plates can be introduced, the individual plates having optically active structures which correspond to a defined Zernike polynomial and to a defined amplitude, at least one order Xi of the Zernike polynomial being greater than two.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.