Prism design for scanning applications and illumination of microscopy sample
US7518764B2 · kind B2 · utility
13Cited by
5References
25Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jul 16, 2004 |
| Grant date | Apr 14, 2009 |
| Priority date | — |
| Expiry date | May 1, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02B27/56
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
There is disclosed a prism for use in scanning applications such as total internal reflection microscopy in which the prism is translated relative to an incident light beam. A geometry is disclosed which cancels walk of the beam footprint at the base of the prism. Walk of the beam footprint due to irregularities in a largely planar sample surface located at the prism base are cancelled by coupling movement of the incident light beam to movement of the sample in the field of view of an objective lens, for example as part of an autofocus arrangement.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.