Method and system for determining process parameters
US7520667B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 11, 2006 |
| Grant date | Apr 21, 2009 |
| Priority date | — |
| Expiry date | Oct 4, 2026 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH05B6/062
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
The present invention relates to a method and a system for determining a set of process parameters of a treatment unit in which unit a product is subjected to a temperature treatment, the method comprising: subjecting a product to an electromagnetic signal before, during and/or after a temperature treatment, wherein said electromagnetic signal is adapted to interact with said product dependent upon the dielectric constant distribution of said product, receiving an electromagnetic signal which has interacted with said product, analysing the received electromagnetic signal in comparison with the transmitted electromagnetic signal and thereby determining a response being dependent upon the dielectric constant distribution of said product and based thereupon determine the temperature (distribution) or water content of the product, and analysing said temperature distribution or temperature of the product or products and based thereupon determining a set of process parameters for a temperature treatment in a treatment unit.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.