Ionization plate for mass spectrometry and mass spectrometer
US7521672B2 · kind B2 · utility
1Cited by
1References
19Claims
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Key dates
| Filing date | Apr 27, 2006 |
| Grant date | Apr 21, 2009 |
| Priority date | — |
| Expiry date | Jun 22, 2027 |
Classification
- Technology area (CPC B)Performing Operations; Transporting
- CPC primaryB82Y10/00
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
Provided are a laser desorption ionization mass spectrometry sample plate for a soft LDI-MS measurement, in which when a laser beam is irradiated, a correct measurement of high sensitivity can be made without generation of any disturbance peak and uniform coating of a sample can be made on a sample plate in fabrication of the sample, and a measurement apparatus using the sample plate. A specified ionization element having a dot structure is used as an ionization medium which is used in laser desorption ionization mass spectrometry and absorbs a laser beam.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.