Workpiece assessment system and method for using the same
US7523017B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | May 30, 2007 |
| Grant date | Apr 21, 2009 |
| Priority date | — |
| Expiry date | May 30, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06Q10/10
- WIPO fieldIT methods for management
- WIPO sectorElectrical engineering
Abstract
An assessment system (100) used to creating an assessment of workpieces includes a database module (40), a connecting module (20), and a server module (30). The database module stores computer aided design (CAD) drawings of the checked workpieces. The database module and the server module are connected to each other via the connecting module. The server module is connected to the database module and includes an inquiry module and a processor module. The inquiry module inquires the CAD drawings of each checked workpiece and acquires relational parameters of the checked workpieces from the CAD drawings. The processor module processes the parameters acquired by the inquiry module, and the server module creates an assessment according to the parameters and data processed by the processor module.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.