Apparatus, system and method for measuring stress
US7523671B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 5, 2007 |
| Grant date | Apr 28, 2009 |
| Priority date | — |
| Expiry date | Aug 7, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01L1/125
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system for measuring stress including a coilless sensor including at least one band of electrically conductive and magnetostrictive material, the band having a first end and a second end defining a gap therebetween, a measuring circuit electrically connected to the first and second ends of the coilless sensor, the measuring circuit being configured to pass a current through the coilless sensor and measure at least one of an inductance, a resistance and an impedance of the coilless sensor in response to the current, and a processor in electrical communication with the measuring circuit, the processor being configured to calculate an amount of stress being applied to the coilless sensor based upon the measured inductance, resistance and impedance.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.