Systems and methods for resistance compensation in a temperature measurement circuit
US7524109B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 23, 2007 |
| Grant date | Apr 28, 2009 |
| Priority date | — |
| Expiry date | Oct 31, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01K15/00
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Various systems and methods for temperature measurement are disclosed. For example, some embodiments of the present invention provide methods for temperature measurement that include exciting a provided transistor with at least four sequential input signals of different magnitudes. In response, the transistor exhibits a sequence of output signals corresponding to the four sequential input signals. The sequence of output signals is sensed using a different gain for each of the output signals included in the sequence of output signals, and the output signals included in the sequence of output signals are combined such that the combined output signals eliminates a resistance error. The combined output signals are then used to calculate a temperature of the transistor.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.