Multiple axis multipoint non-contact measurement system
US7525114B2 · kind B2 · utility
11Cited by
11References
5Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Mar 16, 2007 |
| Grant date | Apr 28, 2009 |
| Priority date | — |
| Expiry date | Mar 16, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B11/026
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Apparatus for optically measuring a remote object comprises at least one source for projecting a plurality of discrete zones of electromagnetic radiation (for example laser spots) along a projection plane. Imaging apparatus images a plurality of reflections from the remote object. By spatially offsetting the imaging apparatus from the projection plane, crosstalk between opposing cameras imaging the same object is more easily avoided. The same effect as spatially offsetting the imager can be achieved by rotating the light source to provide a reflection axis that is not perpendicular to the optical axis.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.