Automatic testing apparatus and method
US7525303B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Jun 12, 2006 |
| Grant date | Apr 28, 2009 |
| Priority date | — |
| Expiry date | Feb 21, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/01
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An automatic testing apparatus (200) includes a transmission floor (210), a board (220), a stopping unit (230), and a testing device (260) beside the transmission floor. The transmission floor includes a plurality of rollers (211) positioned at two sides thereof. The board positioned on the rollers includes an I/O (input/output) circuit (222) and a first connector (265) electrically connected to the I/O circuit. The testing device includes a second connector (225) matchable with the first connector. The I/O circuit is used to electrically connect to an electronic device to be tested, such as an LCD (280). The stopping unit is positioned at the transmission floor for stopping the board moving. An automatic testing method using the automatic testing apparatus for testing an electronic device is also provided. The efficiency of the automatic testing apparatus is high.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.