Millimeter-wave interrogation relating features
US7528763B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 17, 2006 |
| Grant date | May 5, 2009 |
| Priority date | — |
| Expiry date | Apr 1, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01S13/89
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Methods for interrogating a subject with millimeter-wave electromagnetic radiation, and generating data representative of a selected feature of a subject may include serial comparative interrogating for processing. Serial processing may include first interrogating a given subject at a first time, generating a data set from the first interrogating, second interrogating the subject at a second time different than the first time, generating a data set from the second interrogating, and identifying information corresponding to a given feature of the subject from each data set. Non-serial processing may include interrogating a subject, generating a data set from the interrogating, identifying information corresponding to a first feature of the subject, and identifying information corresponding to a second feature of the subject. Processing may also include comparing the information identified, and/or rendering representations of the information identified and presenting the representations rendered.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.