Patent · US Active

Method and system for testing of magnetic disks using F-BER

US7529049B2 · kind B2 · utility

1Cited by

13References

17Claims

0Family size

Assignee

Hitachi Global Storage Technologies Netherlands B.V. · NL

Inventors

Shanlin Duan · Fremont, US
Zhupei Shi · San Jose, US
Li Tang · Fremont, US
Jane Jie Zhang · San Jose, US

Key dates

Filing date	Sep 1, 2006
Grant date	May 5, 2009
Priority date	—
Expiry date	Jan 17, 2027

Classification

Technology area (CPC G)Physics
CPC primaryG11B19/048
WIPO fieldAudio-visual technology
WIPO sectorElectrical engineering

Abstract

Spinstand test improvement that measures Functional Byte Error Rate (F-BER) of a disk. The F-BER is correlated to the BER of a disk. The F-BER test is faster than a BER test. The F-BER test is incorporated into a spinstand tester or the software associated with a spinstand tester.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.