Patent · US Expired

Method and apparatus for head gimbal assembly testing

US7529635B2 · kind B2 · utility

10Cited by
51References
10Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 11, 2005
Grant dateMay 5, 2009
Priority date
Expiry dateFeb 11, 2025

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10T29/4903
  • WIPO fieldAudio-visual technology
  • WIPO sectorElectrical engineering

Abstract

A method for dynamic electrical testing of head gimbal assemblies may include initiating an automated continuous process that includes selecting an unmounted head gimbal assembly; aligning the unmounted head gimbal assembly; loading the unmounted head gimbal assembly to a disc; and testing the unmounted head gimbal assembly.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.