Sampler for sampling charged particles, and apparatus for measuring charge distribution of the charged particles
US7530279B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 22, 2006 |
| Grant date | May 12, 2009 |
| Priority date | — |
| Expiry date | Feb 16, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG03G15/0848
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
A sampler introduces charged particles to be measured into an measuring apparatus for measuring charge distribution of the charged particles. The measuring apparatus has a main body, a guide member, and an electric field curtain generating section. The main body has a first opening at upper side and a second opening at lower side, the first opening being adapted to receive the charged particles, the second opening being adapted to discharge the charged particles. The guide member defines a path of the charged particles, the path extending vertically from the first opening to the second opening. The electric field curtain generating section generates an electric field curtain adjacent to a guide surface of the guide member.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.