Patent · US Expired

Mask forming method, mask forming functional layer, dry etching method, and method of manufacturing an information recording medium

US7531103B2 · kind B2 · utility

1Cited by
5References
5Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 23, 2004
Grant dateMay 12, 2009
Priority date
Expiry dateNov 18, 2025

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10T428/24802
  • WIPO fieldAudio-visual technology
  • WIPO sectorElectrical engineering

Abstract

A mask forming method forms an A mask forming functional layer with an amorphous structure so as to cover an etched body, forms a B mask forming functional layer so as to cover the formed A mask forming functional layer, forms a convex/concave pattern in the formed B mask forming functional layer by carrying out a predetermined process to form a B mask on the A mask forming functional layer, and forms an A mask on the etched body by forming a convex/concave pattern in the A mask forming functional layer by dry etching the A mask forming functional layer using the B mask. By doing so, a convex/concave pattern with extremely small pattern fluctuations can be formed in the A mask forming functional layer.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.