Projector for an arrangement for three-dimensional optical measurement of objects
US7532332B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 19, 2006 |
| Grant date | May 12, 2009 |
| Priority date | — |
| Expiry date | Apr 19, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B11/2531
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A projector for an arrangement for three-dimensional optical measurement of objects (6) with the aid of a topometric measuring method in which images of projection patterns (2) projected onto an object (6) are acquired and evaluated, the projector having an illumination unit (4) and a carrier (1), provided with projection patterns (2), for projecting the light structures. The object is achieved by virtue of the fact that projection patterns (2) are arranged on the carrier (1) in the form of repeating geometrical individual structures, and the carrier (1) with the projection patterns (2) is movably arranged in such a way that during the movement and illumination selected regions of the projection pattern (2) are displaced into the beam path (7) between the illumination unit (4) and object (6), and a stripe-shaped pattern is imaged on the object (6) by means of the movement unsharpness.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.