Monolithically integrated vertical pin photodiode used in biCMOS technology
US7535074B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 12, 2003 |
| Grant date | May 19, 2009 |
| Priority date | — |
| Expiry date | Jul 25, 2024 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10F30/223
Abstract
The invention relates to a monolithically integrated vertical pin photodiode which is produced according to BiCMOS technology and comprises a planar surface facing the light and a rear face and anode connections located across p areas on a top face of the photodiode. An i-zone of the pin photodiode is formed by combining a low doped first p-epitaxial layer, which has maximum thickness and doping concentration, placed upon a particularly high doped p substrate, with a low doped second n− epitaxial layer that borders the first layer, and n+ cathode of the pin photodiode being integrated into the second layer. The p areas delimit the second n epitaxial layer in a latent direction while another anode connecting area of the pin diode is provided on the rear face in addition to the anode connection.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.