System for display test
US7535248B2 · kind B2 · utility
2Cited by
17References
10Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Sep 26, 2007 |
| Grant date | May 19, 2009 |
| Priority date | — |
| Expiry date | Sep 26, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG09G3/3648
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
The system for display test includes a driving circuit having integrated circuit (IC) pads on the substrate and the IC pads are electrically connected to the signal lines, respectively. And the first switches are between the first test pads and the IC pads, wherein the number of the first test pads is less than the number of the IC pads.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.