Method for optical chassis measurement
US7535558B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 16, 2006 |
| Grant date | May 19, 2009 |
| Priority date | — |
| Expiry date | Nov 16, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B2210/28
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The invention relates to a method for optically measuring a chassis at a testing station. According to said method, radiation that is reflected by a surface structure of a vehicle, comprising at least one wheel (5) and a surrounding bodywork section, is detected by a measuring device with the aid of appropriate sensors, and at least the wheel plane and the wheel center point are determined by an evaluation of the positional data obtained by means of the detected radiation. To achieve a reliable, precise measurement of the chassis in a simple operation, the surface structure of at least the vehicle bodywork section and at least the wheel is scanned, over its entire surface or at least by any two lines that record both the wheel and the bodywork, using a laser beam (12) that is emitted by the measuring device (10), and at least two surface profiles are obtained from the scanned surface structure as characteristic structures.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.