Anti-symmetrized electromagnetic measurements
US7536261B2 · kind B2 · utility
27Cited by
12References
13Claims
0Family size
Assignee
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Key dates
| Filing date | Apr 13, 2006 |
| Grant date | May 19, 2009 |
| Priority date | — |
| Expiry date | Dec 7, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01V3/28
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method to determine a parameter of a subsurface formation such as anisotropy and dip comprises making at least two cross dipole measurements and forming an anti-symmetrized combination from the at least two cross dipole measurements.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.