Universal X-ray fluorescence calibration technique for wire surface analysis
US7536266B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 17, 2006 |
| Grant date | May 19, 2009 |
| Priority date | — |
| Expiry date | Aug 3, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2223/076
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A non-flat sample is analyzed by a first spectrometer which has previously been calibrated for flat sample analysis. The non-flat sample is then analyzed by a second spectrometer calibrated for flat samples. The values collected from analysis of the non-flat sample by the first spectrometer are plotted against values collected from analysis of non-flat samples by the second spectrometer. The plot identifies a differences between the first spectrometer values and the second spectrometer values. The plot values are used in conjunction with the standard values from the first spectrometer to calculate final standard values for the second spectrometer. Final standard values for the second spectrometer are then used to generate calibration curves for the second spectrometer.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.