Ion detection device and method with compressing ion-beam shutter
US7538320B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Jun 27, 2007 |
| Grant date | May 26, 2009 |
| Priority date | — |
| Expiry date | Nov 21, 2027 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J49/00
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
An ion detection device, method and computer readable medium storing instructions for applying voltages to shutter elements of the detection device to compress ions in a volume defined by the shutter elements and to output the compressed ions to a collector. The ion detection device has a chamber having an inlet and receives ions through the inlet, a shutter provided in the chamber opposite the inlet and configured to allow or prevent the ions to pass the shutter, the shutter having first and second shutter elements, a collector provided in the chamber opposite the shutter and configured to collect ions passed through the shutter, and a processing unit electrically connected to the first and second shutter elements. The processing unit applies, during a first predetermined time interval, a first voltage to the first shutter element and a second voltage to the second shutter element, the second voltage being lower than the first voltage such that ions from the inlet enter a volume defined by the first and second shutter elements, and during a second predetermined time interval, a third voltage to the first shutter element, higher than the first voltage, and a fourth voltage to the s…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.