RFID tag test antenna with two ports that excite perpendicular modes
US7538679B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Nov 7, 2006 |
| Grant date | May 26, 2009 |
| Priority date | — |
| Expiry date | Nov 29, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2822
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Methods, systems, and apparatuses for RFID devices, such as tag test methods, are described. A tag of a strip of tags is positioned adjacent to an opening in an electrically conductive sheet, the tag having first and second orthogonally polarized antennas. A first RF test signal is transmitted through the opening to test the first antenna of the tag. The tag is positioned such that the first RF test signal has a polarization substantially the same as the first antenna and substantially orthogonal to a polarization of the second antenna. A second RF test signal is transmitted through the opening to test the second antenna of the tag. The tag is positioned such that the second RF test signal has a polarization substantially the same as the second antenna and substantially orthogonal to the polarization of the first antenna. If proper responses to both of the first and second RF test signals are received, the tag has passed the test. This test may be repeated for further tags in the strip of tags as desired.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.