Apparatus and method for three-dimensional coordinate measurement
US7539340B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 23, 2004 |
| Grant date | May 26, 2009 |
| Priority date | — |
| Expiry date | Oct 6, 2027 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J2237/2611
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
A three-dimensional coordinate measuring apparatus has a first and second incident angle adjusting sections for adjusting the attitude of the object in the directions of first and second neutral axes, respectively, to adjust the incident angle of the beam projected on the object from an imaging optical system relative to the object so that first and second stereoscopic images of the object can be formed, a matching process section for searching for corresponding points corresponding to measurement points in first and second search directions generally perpendicular to the first and second neutral axes, respectively, in the first and second stereoscopic images, and a shape measuring section for obtaining three-dimensional coordinate data of the object based on the relation between the measurement points and the corresponding points in the first and second stereoscopic images.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.