Abnormality diagnosing method, condition appraisal apparatus, image forming apparatus, management apparatus and management system
US7539599B2 · kind B2 · utility
13Cited by
11References
34Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Feb 11, 2005 |
| Grant date | May 26, 2009 |
| Priority date | — |
| Expiry date | Sep 29, 2026 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N2201/0091
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
Abnormality diagnosing method in which a highly reliable abnormality diagnosis of an image forming apparatus can be initiated immediately following the delivery of the image forming apparatus to a user.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.