Method and apparatus for determining a predicted failure rate
US7539907B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | May 5, 2006 |
| Grant date | May 26, 2009 |
| Priority date | — |
| Expiry date | Jul 21, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/008
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method and apparatus for determining predicted failure rates for computational resources provided by a system comprising multiple components. The method comprises storing failure rate information about individual components and determining a current configuration of components within the system. The method further comprises identifying from the current configuration dependencies between components within the system. The stored failure rate information and the identified current configuration dependencies can then be used to generate predicted failure rates for the computational resources in the current configuration of the system.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.