Method and apparatus for offset and gain compensation for analog-to-digital converters
US7541952B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 10, 2007 |
| Grant date | Jun 2, 2009 |
| Priority date | — |
| Expiry date | Oct 10, 2027 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03M1/1215
- WIPO fieldBasic communication processes
- WIPO sectorElectrical engineering
Abstract
A method for determining a gain compensation value for multiple ADCs sums an absolute value of a number of ADC output samples from each of the ADCs that may be collected while the ADCs are in normal operation. In one embodiment, the ratio of the sums of the absolute values of ADC output samples may reflect the difference in gains between the ADCs, and may be used to determine the ADC gain compensation value. A method for determining an offset compensation value between for multiple ADCs averages of a number of ADC output samples from each ADC collected while the ADCs are in normal operation. In one embodiment, a difference between the ADC sample averages may reflect the difference in magnitudes of the ADC offsets for each ADC, and may be used to determine the ADC offset compensation value.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.