Structure monitor system
US7542856B2 · kind B2 · utility
4Cited by
1References
24Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jul 2, 2003 |
| Grant date | Jun 2, 2009 |
| Priority date | — |
| Expiry date | Jan 31, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01K11/32
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A structure monitor system comprising a measuring unit 3 for measuring distortions of the structure S at respective points on a boundary by using an optical fiber sensor 2 laid on the boundary of the structure, numerical analysis unit 5 for calculating a distortion at a specified point on the structure S by a numerical analysis method with distortions measured by the measuring unit as a boundary condition, and a display unit 6 for displaying information on an analysis distortion by the numerical analysis unit 5 in a association with a position on the structure S.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.