Test data reporting and analyzing using data array and related data analysis
US7543198B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 21, 2005 |
| Grant date | Jun 2, 2009 |
| Priority date | — |
| Expiry date | Jun 2, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C2029/5604
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Reporting and/or analyzing test data from a plurality of tests of an array structure using a data array. One method includes obtaining the test data, and reporting the test data in a data array, which includes at least two portions representing different tests. Data stored in the data array is organized according to a translation table, which describes the locations of data for tests and criteria for data to be analyzed within the data array. Numerous other data arrangements such as a coordinate file listing a pre-defined maximum number of fail points, or a chip report including fail points by chip may also be generated. The data array reports all test data in a more easily generated and stored form, and may be converted to an image. A data analysis method for analyzing data using the data array is also presented.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.