Electrical test probes with a contact element, methods of making and using the same
US7545159B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Jan 10, 2007 |
| Grant date | Jun 9, 2009 |
| Priority date | — |
| Expiry date | Jan 10, 2027 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01R13/2421
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
Disclosed herein are electrical test probes and methods for making the same. In one embodiment, an electrical test probe comprises: a barrel, a plunger, a contact element, and a spring. The barrel comprises a contact area defined by a stop engagement and an opening at a first end of the barrel. The plunger is slidably disposed through the opening, the contact element, and the contact area. The plunger comprises a tip and a stop protrusion with a plunger extension extending therebetween. The contact element is disposed in the contact area, between the barrel and the plunger. The spring is in operational engagement with the plunger.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.