Condition-analyzing device
US7545279B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Jun 3, 2004 |
| Grant date | Jun 9, 2009 |
| Priority date | — |
| Expiry date | Jan 2, 2025 |
Classification
- Technology area (CPC A)Human Necessities
- CPC primaryA61B5/4818
- WIPO fieldMedical technology
- WIPO sectorInstruments
Abstract
A condition analysis apparatus capable of grasping the condition of an object easily and accurately is provided. The condition analysis apparatus 1 includes a three-dimensional sensor 10 for measuring sampling-point-moves in the height direction of an object 2 existing in a target area at a plurality of sampling points, and area definition means 22 for defining an area where a plurality of the sampling-point-moves are in the generally same phase. The thus constructed condition analysis apparatus 1 can grasp the condition of the object 2 easily and accurately. Preferably, the condition analysis apparatus 1 includes information output means 40 for outputting information of an area including the area defined by the area definition means 22.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.