Technique to remove sensing artifacts from a linear array sensor
US7547903B2 · kind B2 · utility
3Cited by
1References
18Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Nov 14, 2007 |
| Grant date | Jun 16, 2009 |
| Priority date | — |
| Expiry date | Nov 14, 2027 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N2201/0082
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
Disclosed is a method and system for calibrating an image capturing sensor. The method and system include generating a test pattern on an image receiving device and measuring one or more colorimetric properties of the test pattern with an image sensor. The disclosed method and system measure the test pattern with the image sensor located in two or more different cross-process positions to determine an independent uniformity profile for the image sensor and the image rendering process.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.