Capacitive single-electron transistor
US7550759B2 · kind B2 · utility
8Cited by
2References
9Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jul 18, 2005 |
| Grant date | Jun 23, 2009 |
| Priority date | — |
| Expiry date | Jul 8, 2026 |
Classification
- Technology area (CPC B)Performing Operations; Transporting
- CPC primaryB82Y10/00
- WIPO fieldMicro-structural and nano-technology
- WIPO sectorChemistry
Abstract
The invention is a sensitive measuring instrument, which is principally applied to quantum computation, especially to measurement of quantum bits consisting of superconducting micro and nano-structures. The state of a quantum bit is expressed as the voltage-time integral over a circuit component. Phase measurement is performed by measuring the capacitance of a single-electron transistor between the gate and ground.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.