Patent · US Expired

Vertically spaced plural microsprings

US7550855B2 · kind B2 · utility

6Cited by
40References
27Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 2, 2005
Grant dateJun 23, 2009
Priority date
Expiry dateMay 26, 2026

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH05K3/4092
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A plurality of vertically spaced-apart microsprings are provided to increase microspring contact force, contact area, contact reliability, and contact yield. The microspring material is deposited, either as a single layer or as a composite of multiple sub layers, to have a tailored stress differential along its cross-section. A lower microspring may be made to push up against an upper microspring to provide increased contact force, or push down against a substrate to ensure release during manufacture. The microsprings may be provided with similar stress differentials or opposite stress differentials to obtain desired microspring profiles and functionality. Microsprings may also be physically connected at their distal ends for increased contact force. The microsprings may be formed of electrically conductive material or coated with electrically conductive material for probe card and similar applications.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.