Method for detecting vertical transfer defects in image sensors
US7551213B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 12, 2005 |
| Grant date | Jun 23, 2009 |
| Priority date | — |
| Expiry date | Apr 19, 2027 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N25/73
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A charge transfer implemented by a transfer section for transferring charges stored in image sensor elements along one direction on a surface where the image sensor elements are disposed is halted for a predetermined length of time. The charges are transferred from the transfer section without reading the charges from the image sensor elements after the charge transfer is halted for the predetermined length of time. A position where a defect is generated in an image pickup sensor is identified based on signal levels of the transferred charges. A defective signal level of the image pickup sensor generated on a line including the defect-generating position and in parallel with the one direction is corrected. As a result of the foregoing process, a display failure is precisely corrected.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.