Method and system for automatic vision inspection and classification of microarray slides
US7551762B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Oct 8, 2004 |
| Grant date | Jun 23, 2009 |
| Priority date | — |
| Expiry date | Jan 27, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V2201/04
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
The present invention provides a unique low cost vision inspection and classification system and methods for automatic inspection and classification of a microarray slide without manual intervention. The method first performs morphological dilation operation several times such that internal microarray spots are merged as a big connected component; then, the orientation of the merged spots, with respect to the X-axis and Y-axis is computed by computing the angle of the external boundaries of the connected component using Sobel XY operators for both edges and orientation determination, or using the moment-based algorithm for direct orientation determination; and the translational offset is determined by finding the X and Y centroids of the connected component. Moreover, the present invention provides threshold methods for classifying spots into normal spots, weak spots, missing spots, or overlapping spots.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.