Electronic component detection system
US7551765B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 14, 2004 |
| Grant date | Jun 23, 2009 |
| Priority date | — |
| Expiry date | Jul 2, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30141
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
The present invention provides a method and a system for determining whether a target component of an electronic assembly is assembled correctly. The method of the present invention involves correlating the view of a test electronic assembly with both a positive control image and a negative control image. The positive control image is an image of an electronic assembly that has been assembled properly, whereas the negative control image is an image of an electronic assembly that has been assembled improperly. If the correlation between the test image and the positive control image is greater than the correlation between the test image and the negative control image, the test assembly is assembled properly. On the other hand, if the correlation between the test image and the negative control image is greater than the correlation between the test image and the positive control image, the test assembly is assembled improperly.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.