Patent · US Active

Probe for gauging machines

US7552543B2 · kind B2 · utility

16Cited by
7References
25Claims
0Family size

Assignee

Inventor

Key dates

Filing dateJul 18, 2008
Grant dateJun 30, 2009
Priority date
Expiry dateJul 18, 2028

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01B7/012
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A probe for gauging machines with articulated arms comprises a fixed gauging stylus (31), supporting, at its end, a gauging ball, characterized in that it also comprises a handle body (33) which can be manually operated by an operator to push the gauging ball against a surface to be gauged (13), and in that the handle body (33) is equipped with sensors sensitive to the force acting between the gauging ball and the surface to be gauged and in that the signal supplied by the sensors controls measurement acquisition.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.